中文版
English
Column navigation
Instruments for Surface Analysis
- LM (Light microscope)[Click for details]
- SEM (scanning electron microscope)[Click for details]
- SPM/AFM (Scanning Probe Microscopy /Atomic Force Microscope)[Click for details]
- TEM (Transmission electron microscope)[Click for details]
- EDS (Energy Dispersive Spectrometer)[Click for details]
- XPS/ESCA (X-ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis )[Click for details]
- AES (Auger Electron Spectroscopy)[Click for details]
- SIMS (Secondary Ion Mass Spectroscopy)[Click for details]
- FIB (Focus Ion Beam)[Click for details]
- RAMAN[Click for details]
- FTIR (Fourier Transform infrared spectroscopy)[Click for details]
- EPMA (Electron microprobe analysis)[Click for details]
Copyright © 2010 cyu-china.com.cn All Rights Reserved .